PortaSpec® XLE is designed to fill a need for an instrumental technique that could rapidly and non-destructively analyze light elements in a central laboratory or in the plant using wavelength dispersive X-ray (WDXR) fluorescence. The PortaSpec® XLE has the ability to analyze powders and solids with its included single position sample holder. It also has a single element option for Al, Si, P, S, Cl, K, Ca, or Zr and can measure Zirconium or Phosphorus pretreatment.
The PortaSpec® XLE is operated by a PC Notebook Computer, complete with Windows®-based preinstalled Software.